Q. If the primary ion is elastically scattered, the kinetic energy of the reflected primary ion will depend on which of the following?

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Q. Which of the following causes the phenomena of sputtering?

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Q. The fragments formed during sputtering can be either neutral atoms or ions. The ions can only be positive.

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Q. Which of the following is the energy range of ISS?

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Q. Which of the following is the spectral range of SIMS?

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Q. Both ISS and SIMS have depth profiling capability.

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Q. Which of the following is denotes the absolute quantitative analysis of SIMS?

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Q. Which of the following is the amount of matrix effect that occurs in SIMS?

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Q. Which of the following is the x-y resolution of ISS?

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Q. Which of the following is the x-y resolution of SIMS?

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Q. In ion spectroscopy, the positive ions are focussed on the sample at which of the following angles?

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Q. Only those electrons which are in a selected small solid angle are received in the ________ electrostatic analyser.

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Q. Which of the following can be used as the detector in ion spectroscopy?

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Q. In order to obtain ISS spectra, the backscattered primary ions are sampled by which of the following?

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Q. Which of the following is the energy after collision with a surface atom for a scattering angle of 90° when E₀ is the energy of the incident ion, M₁ is the mass of the incident ion and M₂ is the mass of the target surface?

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Q. It is advantageous to use ions from a variety of gases.

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Q. Which of the following gases is not often used in ion spectroscopy?

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Q. ISS is sensitive to every element heavier than which of the following?

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Q. Which of the following is the lightest isotope used as a primary ion?

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Q. The specificity will vary depending on the scattering gas used.

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