Q. Specimens used in electron microscopy must be less than

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Q. For electron microscopy, specimen must be thin to

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Q. Television screen used in scanning electron microscope for image display is scanned synchronously with the

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Q. Deflection of cantilever in atomic force microscopy can be seen as

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Q. Electrons can be focused by bending their paths in

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Q. Surface detail can be studied using

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Q. Very useful detail can be obtained from study of

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Q. Quantitative determination of twist angles in wool is done by

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Q. Tapping mode of atomic force microscopy can be used to show differences in

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Q. Scanning has been applied to the

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Q. Obtaining contrast in electron microscopy is

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Q. In scanning electron microscope method, image formed looks like an ordinary

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Q. Contrast is emphasized by a technique in which heavy metal atoms are deposited on specimen to give appearance of

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Q. Main use of scanning electron microscopy in fibre science has been in range of

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Q. Technique in which an image is formed from a particular selected band of diffracted electrons is called as

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Q. Tapping mode of atomic force microscopy gives

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Q. Increased sensitivity in scanning electron microscopy has resulted in

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Q. Electrons can only act if they are waves with a wavelength of order of

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Q. Magnitude increase in voltage has enabled high voltage electron microscopes to be used with

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Q. Electron microscope is used for specimens that are

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