Q. Total reflection X-ray fluorescence spectrometer is attractive for elements which lack reliable wet chemical methods.

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Q. Which of the following is not a type of optics employed in electron probe microanalyser?

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Q. The electron optics consists of an electron gun followed by which of the following components?

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Q. The specimen is mounted inside which of the following components?

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Q. The electrons are accelerated by voltages in which of the following ranges?

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Q. Electron probe microanalyser is a method of destructive elemental analysis.

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Q. Which of the following is the effective resolution limit in electron probe microanalyser?

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Q. Micro probe analyser cannot be used on inhomogeneous material.

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Q. X-ray emission must be analysed against a background of _______ radiation.

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Q. Which of the following is the limit of detectability of electron microprobe analyser?

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Q. The alternative method using laser does not analyse vapours by which of the following methods?

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Q. Given below is the block diagram of X-ray spectrometer. Identify the unmarked component.

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Q. Given below is the diagram of energy dispersive system. Identify the unmarked component.

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