Q. Electron probe microanalyser is a method of destructive elemental analysis.

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Q. The electrons are accelerated by voltages in which of the following ranges?

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Q. The specimen is mounted inside which of the following components?

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Q. The electron optics consists of an electron gun followed by which of the following components?

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Q. Which of the following is not a type of optics employed in electron probe microanalyser?

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Q. Total reflection X-ray fluorescence spectrometer is attractive for elements which lack reliable wet chemical methods.

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Q. In computer-controlled corrective iteration method, which of the following is used to estimate absorption corrections?

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Q. Computer-controlled corrective iteration is the only reliable method of matrix effects correction.

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Q. The major problem associated with sample preparation is which of the following?

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Q. To monitor the primary beam, which of the following is used?

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Q. Which of the following happens when a large solid angle is intercepted as the detector is placed close to the sample?

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Q. Which of the following devices are used as a detector?

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Q. Which of the following components are used as the sample carrier?

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Q. The suppression of high energy bremsstrahlung radiation improves which of the following?

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Q. Which of the following crystals are polished to act as the cut-off reflector?

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Q. The x-ray beam produced by the primary x-ray tube passes through which of the following components to produce the incident radiation?

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Q. In total reflection X-ray fluorescence spectrometer, the specimen is excited by the primary X-ray beam at a grazing angle _______ the critical angle.

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Q. Which of the following is the disadvantage of silicon semiconductor detector?

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Q. In curved crystal arrangement, angular velocity of the crystal is twice that of the detector.

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Q. Which of the following can be done to avoid loss of intensities of X-rays due to the absorption of long wavelength X-rays?

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