Q. Which of the following is the disadvantage of silicon semiconductor detector?

View solution

Q. In total reflection X-ray fluorescence spectrometer, the specimen is excited by the primary X-ray beam at a grazing angle _______ the critical angle.

View solution

Q. The x-ray beam produced by the primary x-ray tube passes through which of the following components to produce the incident radiation?

View solution

Q. Which of the following crystals are polished to act as the cut-off reflector?

View solution

Q. The suppression of high energy bremsstrahlung radiation improves which of the following?

View solution

Q. Which of the following components are used as the sample carrier?

View solution

Q. Which of the following devices are used as a detector?

View solution

Q. Which of the following happens when a large solid angle is intercepted as the detector is placed close to the sample?

View solution

Q. To monitor the primary beam, which of the following is used?

View solution

Q. The major problem associated with sample preparation is which of the following?

View solution

Q. Computer-controlled corrective iteration is the only reliable method of matrix effects correction.

View solution

Q. In computer-controlled corrective iteration method, which of the following is used to estimate absorption corrections?

View solution

Q. Total reflection X-ray fluorescence spectrometer is attractive for elements which lack reliable wet chemical methods.

View solution

Q. Which of the following is not a type of optics employed in electron probe microanalyser?

View solution

Q. The electron optics consists of an electron gun followed by which of the following components?

View solution

Q. The specimen is mounted inside which of the following components?

View solution

Q. The electrons are accelerated by voltages in which of the following ranges?

View solution

Q. Electron probe microanalyser is a method of destructive elemental analysis.

View solution

Q. Which of the following is the effective resolution limit in electron probe microanalyser?

View solution

Q. Micro probe analyser cannot be used on inhomogeneous material.

View solution