Q. For obtaining useful information from replicas, it is obtained from

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Q. In scanning electron microscope, fine spot of electron is transversed across the

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Q. Atomic force microscopy consists of

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Q. In scanning electron microscope method, electrons are picked up by

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Q. Sizes of spot in scanning electron microscopy has been

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Q. For getting internal details another technique used includes examination of fragments that are left behind after

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Q. Scanning electron microscope has an advantage of

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Q. Polymers of which fibers are composed may also be examined as

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Q. Specimens used in electron microscopy must be less than

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Q. For electron microscopy, specimen must be thin to

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Q. Television screen used in scanning electron microscope for image display is scanned synchronously with the

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Q. Deflection of cantilever in atomic force microscopy can be seen as

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Q. Electrons can be focused by bending their paths in

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Q. Surface detail can be studied using

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Q. Very useful detail can be obtained from study of

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Q. Quantitative determination of twist angles in wool is done by

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Q. Tapping mode of atomic force microscopy can be used to show differences in

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Q. Scanning has been applied to the

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Q. Obtaining contrast in electron microscopy is

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Q. In scanning electron microscope method, image formed looks like an ordinary

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